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TANDEM
MASS SPECTROSCOPY: This type of
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spectroscopy
simply involves the coupling of one
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mass
spectrometer to another and this hyphenated
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technique has resulted in dramatic progress in the
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analysis of
complex mixtures.
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SECONDARY
ION MASS SPECTROSCOPY: This
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is one of the
most highly developed of the mass
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spectrometric
surface methods, with several
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manufacturers
offering instruments for this technique.
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It involves the
bombarding of a surface with a beam
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of ions formed in
an ion gun. The ions generated
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from the surface
layer are then drawn into a
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spectrometer for
mass analysis.
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