•TANDEM
MASS SPECTROSCOPY: This type of spectroscopy simply involves the coupling of one mass spectrometer to another and this hyphenated technique has resulted in dramatic progress in the analysis of complex mixtures.
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•SECONDARY
ION MASS SPECTROSCOPY: This is one of the most highly developed of the mass spectrometric surface methods, with several manufacturers offering instruments for this technique. It involves the bombarding of a surface with a beam of ions formed in an ion gun. The ions generated from the surface layer are then drawn into a spectrometer for mass analysis.